1/f Noise in Cr Films From Spin-Density-Wave Polarization Rotation

Measurements were made of the temperature dependence, strain dependence, defect dependence, symmetry properties, and small-sample statistical properties of the large 1/f noise in antiferromagnetic Cr films. The results are consistent with a model based on rotations of the polarization of spin-density-wave domains. Spontaneous electronic symmetry-breaking effects are proposed as a new source of 1/f noise in some metals.