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A Common Language Framework for Next-Generation Embedded Testing

01 September 2010

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ion. Abstract This paper describes NSDL, a language able to efficiently describe embedded testing resources in aid of automated test generation. NSDL is evaluated in the context of the IEEE P1687 standard that is being developed. It is shown that NSDL satisfies all P1687 requirements and provides a complete and flexible framework for future evolutions. Lastly, Section perspectives. 6 will provide conclusions and