A Methodology for Developing Measurement Assurance Programs with Application to the Certification of Diodes in Submarine Lightwave Systems.

In this paper, we propose a methodology for developing measurement assurance programs (MAPs). A MAP is a quality assurance program for a measurement process. The essential feature of a MAP is that it focuses on the whole physical measurement process, i.e., the operator, the environment, the procedures, as well as the instrument. We apply the methodology and supporting techniques developed in this paper to the certification of diodes used in Submarine Lightwave Systems. We estimate the uncertainties in the measurements of diodes and evaluate their effect on the customer. Finally, we evaluate the MAP developed for the diodes against the currently accepted definition of a MAP published by the National Institute of Standards and Technology (previously NBS).