A New Model for Computation of Probabilistic Testability in Combinational Circuits
01 January 1989
This paper presents a technique of Probabilistic Estimation of Digital Circuit Testability (PREDICT). Node controllabilities, observabilities, and detectabilities are defined as probabilities. A graph is used to compute these probabilities using Shannon's expansion. Computational complexity is minimized by partitioning the circuit into "supergates". Experimental results are given to demonstrate the effectiveness of PREDICT.