A Sequential Circuit Test Generator Using Threshold-Value Simulation

Conventional approaches to sequential circuit test generation have two major difficulties: 1) Backtracking in space and time results in high complexity, and 2) Tests generated by neglecting circuit delays cause races and hazards even in the fault-free circuit. In our recent work [1], a simulation-based directed search approach for generating test vectors for combinational circuits was proposed. In this method, the search for a test vector is guided by a cost function computed by the simulator.