Abstracts of Papers by Bell System Authors Published in Other Journals (01 July 1977)

Low-Noise GaAs MESFETS. B. S. Hewitt, et al., Electron. Lett., 12, No. 12 (June 10, 1976), pp. 309-310. GaAs MESFETs with optimum noise figures of 1.6 dB at 6 GHz have been fabricated by projection photolithography. An equation has been developed for the calculation of optimum noise figure which gives good agreement between calculated and measured values. Measurement of Land to Plated-Through-Hole Interface Resistance in Multilayer Boards. J. N. Hines, 14th Annual Proceed., 1976 Reliability Phys. Symp., April 20,1976, pp. 132-134. 

Thermally induced cracks in the bond between an innerlayer land and barrel will occur during the lifetime of an MLB if processing is faulty. A technique to detect incipient failures that features four-terminal resistance measurements with a minimum of bulk resistance to overcome the insensitivity of series circuit measurements is presented. Mechanical-Chemical Technique for Removal of Epitaxial Spikes. L. E. Katz and W. C. Erdman, J. Electrochem. Soc., 123, No. 8 (August 1976), pp. 1249-1251. A new mechanical-chemical spike removal technique has been devised which effectively removes epitaxial spikes on silicon substrates. 

A mask damage technique was used to evaluate masks subjected to spike removal. Results show effective spike removal as well at no subsequent mask damage. Millimeter Wave Integrated Circuit Technologies. R. H. Knerr and L. F. Moose, Microwave J., 19, No. 11 (November 1976), pp. 23-24. Introduction to a two part series of short articles authored by the participants in a panel discussion on "Millimeter Wave Integrated Circuit Technologies" at the 1976 IEEE-MTT-S International Microwave Symposium.