Skip to main content

Accelerated Life Testing of Electronic Devices by Atmospheric Particles: Why and How

01 November 1993

New Image

Research on atmospheric corrosion and degradation of electronic materials and assemblies is usually carried out without considering the potential effects of airborne submicron particles, most of which are potentially corrosive ionic compounds. Yet data show that, in many urban indoor environments, the mass concentration of these particles and their arrival rate at surfaces are comparable to the mass concentration and arrival rate of corrosive gases. Particles contribute to corrosion of electronics because 1) in the presence of moisture, they either are corrosive or form moisture films that cause electrical leakage and even arcs between conductors.