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Marcus Weldon

Marcus Weldon

Former Corporate CTO and President, Nokia Bell Labs

Murray Hill, NJ, USA

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Biography

As Corporate Chief Technology Officer, Marcus Weldon is responsible for coordinating the technical strategy across the company and driving technological and architectural innovations into Nokia’s end-to-end networking systems and software portfolio.  In addition, as President of Nokia Bell Labs, Marcus is responsible for driving the next disruptive innovation and research agenda for the company.

Marcus is considered one of the luminaries in the ICT industry in terms of the clarity, depth and breadth of his vision. He combines his vision with the power of Bell Labs, to create a unique innovation engine whose goal is to ‘invent the future’ of the networking and communications industry.

Tweet me at @MarcusWeldon

Books

Editor of the book “The Future X Network: A Bell Labs Perspective” (Taylor and Francis, 2015).

Memberships

Corporate Chief Technology Officer and President of Nokia Bell Labs, 2016-2021

Corporate Chief Technology Officer and President of Bell Labs, Alcatel-Lucent
2013-2016

Corporate Chief Technology Officer, Alcatel-Lucent 2009-2013

Chief Technology Officer, Broadband Networks & Solutions, Alcatel-Lucent 2006-2009

Member of Technical Staff, Bell Labs, Lucent Technologies 1997-2006

Postdoctoral Member of Technical Staff, AT&T Bell Labs 1995-1997

Named in Global Telecoms Business Power 100 of the most influential people in ICT in 2014

Named among Global Telecoms Business ‘Top CTOs to watch in 2015’

Served on the Board of Trustees of the Liberty Science Center in New Jersey and an advisor to select Venture Funds

Education

BSc in Chemistry and Computer Science, King's College, London

PhD in Physical Chemistry, Harvard University, Cambridge, MA

Selected Articles and Publications

"Infrared spectroscopic analysis of the Si/SiO2 interface structure of thermally oxidized silicon", Queeney K.T., Weldon M.K., Chang J.P., Chabal Y.J., Gurevich A.B., Sapjeta J., Opila R.L., Journal of Applied Physics, Volume 87, Issue 3, 2000

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