In 1990-1992 AT&T will either deploying new or upgrading existing 5ESS (R) Gateway Switches in several countries to support Common Channel Systems No.7 (CCS7).
As a result of recent work on probabilistic testability measures, it is possible to determine the detection probabilities of faults in a circuit.
Since the introduction of the charge-coupled device 1 (CCD) and the bucket-brigade shift registers, 2-4 there have been a number of proposed modifications to the basic structures in order to achiev
The group testing problem is to find by group tests all defectives in a given set of items each of which independently has probability p of being defective.
In an earlier paper1 we showed that stimulated emission of bremsstrahlung exists. This statement has the following meaning.
The novel network slicing paradigm represents an effective turning point to operate future wireless networks.
This paper describes the development of a GaAs MMIC chip-set for Ku-band radio-links transmitter.
This paper describes a method to design a compact linear-in-dB variable-gain amplifier (VGA) with good input/output matching in a wide gain-control range.
A InP/GaAsSb/InP double-heterojunction bipolar transistor (DHBT) structure has been defined, realized by MBE epitaxy, and optimized, thanks to simulation based on in-depth physical characterization
This paper describes the printing of miniature, high-resolution, pictorial images1 by machining with a gallium-arsenide laser.
