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Exchange Narrowing in Paramagnetic Resonance, Revs. Mod. Phys., 25, pp. 269-276, Jan., 1953.
Polycrystalline Thin Film InP/CdS Solar Cells. K. J. Bachmann, J. L. Shay, S. Wagner, and E. Buehler, Appl. Phys. Lett., 29, No. 2 (July 15,1976), pp. 121-123.
circuits are useful for failure analysis and process evaluation.
Lineshape and Strength of Two-Photon Absorption in an Atomic Vapor with a Resonant or Near-Resonant Intermediate State. J. E. Bjorkholm and P. F. Liao, Phys. Rev., 14, No. 2 (August 1976), pp.
MATERIALS SCIENCE Effect of Hydrogen on Amorphous Silicon. J. J. Hauser, Solid State Commun., 19 (1976), pp. 1049-1051.
ELECTRICAL AND ELECTRONIC ENGINEERING Aberrations and Tolerances in a Double-Deflection Electron Beam Scanning System. M. G. R. Thomson, J. Vac. Sci. Technol., 12 (November-December 1975), pp.
Low-Noise GaAs MESFETS. B. S. Hewitt, et al., Electron. Lett., 12, No. 12 (June 10, 1976), pp. 309-310.
Abstracts of Papers by Bell System Authors Published in Other Journals CHEMISTRY Dielectric Anisotropy in Amorphous Ta 2 0 8 Films. P. W. Wyatt, J. Electrochem. Soc., 122 (December 1975), pp.
is negligible, implying that direct emission is responsible for the presence of these compounds. ELECTRONIC AND ELECTRICAL ENGINEERING Frequency-Agile Millimeter-Wave Phase Lock System. P. S.
